ATE Senior Test Engineer (m/f/d)
NXP Semiconductors
Gratkorn
vor 4 Tg.

With segments dedicated to smart cities, retail, payments, identification and IoT Security, the Secure Edge Identification (SEI) team provides a broad set of solutions to protect what's most valuable for people be it data, goods, or private information.

The products within the group enable large diversity of applications which are set for long-term success as the PL SEI offers an invaluable opportunity of an ecosystem play through a healthy mix of mature and emerging markets and leveraging well-established brands in our portfolio (i.

e. MIFARE, UCODE, NTAG, EdgeLock SE).

As Senior Test Development Engineer in this team you will be responsible for :

Developing the characterization and production test solutions

Developing DFT (design for test) concepts, new test methods and mixed signal tests

Driving industrialization of the test solution and transfer to production located in different international NXP test centers

Ramping up support and yield optimization and monitoring continuous improvement

As candidate for this position you :

Provide a Master's degree from a technical university or university of applied sciences in Electronics, Electrical or Measurement Engineering, Physics, or similar technical background

Have 3+ years experience with ATE test knowledge, preferred Advantest 93k (SMT7 / 8) and Teradyne J750

Have experience with Linux system Administration

Provide very good programming know-how (C++, VBA, Java)

Have experience with scripting languages (e.g. Python)

Have experience with testing of electronics

Have basic circuit design know how

Provide solid English language skills

Are a team player

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